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Surface characterization

NanoPRO

This optical profilometer offers a sub-nanometric resolution. It is based on a phase shift interferometric technique.

It’s main application is the flatness measurement of smooth surfaces. The measurements are fast and it is possible to measure large areas using stitching.

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Applications

  • Flatness measurement on smooth surfaced
  • Roughness measurements
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Advantages

  • High resolution measurements
  • Large area using stitching
  • User friendly Acquisition and Analysis software
  • Surfaces alignments using high performance unique algorithm

Related products

OptoSURF

OptoSURF

The OptoSURF is a modular, high-resolution, full-field optical profilometer for the measurement of microstructures and surface conditions.