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Surface characterization


NanoPRO is high-resolution and compact full-field optical profilometer for measuring the geometry of optical components.

It is intended for flatness measurement or curvatures of polished surfaces, measurements can be made on large areas due to movement tables and zone coupling.

OptoSurf software supports acquisition and analysis of 3D surface data: undulation, shaping.

It is intended to the laboratories of synchrotron characterization and to manufacturers and integrators of space optics.



  • Flatness measurement of polished surfaces
  • Roughness measurements
  • Measuring curvatures of polished surfaces


  • High resolution measurements
  • Extended measurement by zone linkage
  • Intuitive analysis and control software
  • Unique high-performance surface alignment

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The OptoSURF is a modular, high-resolution, full-field optical profilometer for the measurement of microstructures and surface conditions.