The OptoSURF is a modular, high-resolution, full-field optical profilometer for the measurement of microstructures and surface conditions.
This measuring station can be adapted to the application and sample size with varying degrees of automation.
It allows to characterize both super polished surfaces (semiconductor and optical) and structured surfaces (metal, plastic, nails, hair…).
Optosurf software supports the acquisition and analysis of 3D surface data: roughness, porosity, density of structural patterns, detection and classification of defects, etc.
A tool to help follow manufacturing processes, it meets the requirements of fine metrology of surface conditions.
The MiniSURF is a compact full-field optical profilometer for the measurement of microstructures and surface states on small samples.
This optical profilometer offers a sub-nanometric resolution. It is based on a phase shift interferometric technique.