Vous utilisez un navigateur dépassé et vous ne pouvez donc pas profiter de toutes les fonctionnalités du site. Nous vous invitons à utiliser un autre navigateur pour une meilleure expérience : Google Chrome, Mozilla firefox ou même Microsoft Edge.
Surface characterization

OptoSURF

The OptoSURF is a modular, high-resolution, full-field optical profilometer for the measurement of microstructures and surface conditions.

This measuring station can be adapted to the application and sample size with varying degrees of automation.

It allows to characterize both super polished surfaces (semiconductor and optical) and structured surfaces (metal, plastic, nails, hair…).

Optosurf software supports the acquisition and analysis of 3D surface data: roughness, porosity, density of structural patterns, detection and classification of defects, etc.

A tool to help follow manufacturing processes, it meets the requirements of fine metrology of surface conditions.  

Related products

MiniSURF

MiniSURF

The MiniSURF is a compact full-field optical profilometer for the measurement of microstructures and surface states on small samples.