OptoSURF

The OptoSURF is a modular, high-resolution, full-field optical profilometer for the measurement of microstructures and surface conditions.

This measuring station can be adapted to the application and sample size with varying degrees of automation.

It allows to characterize both super polished surfaces (semiconductor and optical) and structured surfaces (metal, plastic, nails, hair…).

Optosurf software supports the acquisition and analysis of 3D surface data: roughness, porosity, density of structural patterns, detection and classification of defects, etc.

A tool to help follow manufacturing processes, it meets the requirements of fine metrology of surface conditions.  

NanoPRO

NanoPRO is high-resolution and compact full-field optical profilometer for measuring the geometry of optical components.

It is intended for flatness measurement or curvatures of polished surfaces, measurements can be made on large areas due to movement tables and zone coupling.

OptoSurf software supports acquisition and analysis of 3D surface data: undulation, shaping.

It is intended to the laboratories of synchrotron characterization and to manufacturers and integrators of space optics.