Surface characterization Archives - EOTECH Métrologies de surfaces - Numérisation 3D - Mesures sans contact Wed, 25 Mar 2026 15:50:58 +0000 en-US hourly 1 https://wordpress.org/?v=7.1.3 https://eotech-sa.com/wp-content/uploads/2021/10/favicon-150x150.png Surface characterization Archives - EOTECH 32 32 OptoSURF https://eotech-sa.com/metrology/surface-characterization/optosurf/ https://eotech-sa.com/metrology/surface-characterization/optosurf/#respond Tue, 19 Oct 2021 14:34:48 +0000 http://eotech.fr/?p=7277 The OptoSURF is a modular, high-resolution, full-field optical profilometer for the measurement of microstructures and surface conditions. This measuring station can be adapted to the application and sample size with varying degrees of automation. It allows to characterize both super polished surfaces (semiconductor and optical) and structured surfaces (metal, plastic, nails, hair…). Optosurf software supports […]

L’article OptoSURF est apparu en premier sur EOTECH.

]]> The OptoSURF is a modular, high-resolution, full-field optical profilometer for the measurement of microstructures and surface conditions.

This measuring station can be adapted to the application and sample size with varying degrees of automation.

It allows to characterize both super polished surfaces (semiconductor and optical) and structured surfaces (metal, plastic, nails, hair…).

Optosurf software supports the acquisition and analysis of 3D surface data: roughness, porosity, density of structural patterns, detection and classification of defects, etc.

A tool to help follow manufacturing processes, it meets the requirements of fine metrology of surface conditions.  

L’article OptoSURF est apparu en premier sur EOTECH.

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