Metrology Archives - EOTECH

OptoSURF

Info EOTECH — Tue, 19 Oct 2021 14:34:48 +0000

The OptoSURF is a modular, high-resolution, full-field optical profilometer for the measurement of microstructures and surface conditions.

This measuring station can be adapted to the application and sample size with varying degrees of automation.

It allows to characterize both super polished surfaces (semiconductor and optical) and structured surfaces (metal, plastic, nails, hair…).

Optosurf software supports the acquisition and analysis of 3D surface data: roughness, porosity, density of structural patterns, detection and classification of defects, etc.

A tool to help follow manufacturing processes, it meets the requirements of fine metrology of surface conditions.

L’article OptoSURF est apparu en premier sur EOTECH.

Sensors

Info EOTECH — Wed, 21 Nov 2018 09:17:28 +0000

Philtec’s fiber optic displacement sensors make it possible to measure the distance, displacement and vibrations of a target without contact They are of type D (axis of movement parallel to the probe) or RC (rotation, or translation) and are available inanalog or digital versions controlled by computer.

These sensors operate in the near field and offer a large measurement dynamic from a few nanometers to several tens of millimeters up to 1.5 MHz sampling.

L’article Sensors est apparu en premier sur EOTECH.

Probes and Options

Info EOTECH — Thu, 27 Sep 2018 13:51:33 +0000

The geometry, dimensions and material of the probes can be adapted to the application and its environment: ultra-high vacuum, high pressure, high or cryogenic temperatures, etc.

We offer you a large number of options to adjust the configuration of the system and its probe to your application.

L’article Probes and Options est apparu en premier sur EOTECH.

Colorimeters

DevML — Mon, 04 Jun 2018 16:02:45 +0000

High end colorimeters using tristimulus for measurements of light sources like lamps, light fixtures, light signals, flares, monitors, displays, glasses and filters.

These instruments offer highest precision for absolute measurements with the tristimulus method acc. to DIN 5033 part 6 resp. CIE Publ. No. 15.2 (1966).

Colorimeter heads are equipped with Si-photoelements and high precise spectral adjustment to the CIE color matching functions.

L’article Colorimeters est apparu en premier sur EOTECH.

Luxmeters Photometers

DevML — Mon, 04 Jun 2018 16:02:36 +0000

A complete range of pocket luxmeters, lab or for field use for illuminance measurement and high-precision luminance meeting class requirements B, A and L.

The range of devices offers high measurement dynamics from 0.01 to 600 000 lux

L’article Luxmeters Photometers est apparu en premier sur EOTECH.

Gonio-Photometers

DevML — Mon, 04 Jun 2018 16:01:39 +0000

Goniophotometers for the measurement of light distribution of lamps, indoor and outdoor luminaires, projectors, floodlights, automotive signals and headlamps, traffic and aircraft lights.

Used in certifying laboratories for regulation fulfillment, in automotive and aircraft industries for quality control, development of products and research.

L’article Gonio-Photometers est apparu en premier sur EOTECH.