Micro-displacement measurement Archives - EOTECH Métrologies de surfaces - Numérisation 3D - Mesures sans contact Mon, 26 May 2025 13:50:23 +0000 en-US hourly 1 https://wordpress.org/?v=7.1.3 https://eotech-sa.com/wp-content/uploads/2021/10/favicon-150x150.png Micro-displacement measurement Archives - EOTECH 32 32 Sensors https://eotech-sa.com/metrology/micro-displacement-measurement/sensors/ Wed, 21 Nov 2018 09:17:28 +0000 http://eotech.fr/?p=1528 Philtec’s fiber optic displacement sensors make it possible to measure the distance, displacement and vibrations of a target without contact They are of type D (axis of movement parallel to the probe) or RC (rotation, or translation) and are available inanalog or digital versions controlled by computer. These sensors operate in the near field and […]

L’article Sensors est apparu en premier sur EOTECH.

]]> Philtec’s fiber optic displacement sensors make it possible to measure the distance, displacement and vibrations of a target without contact They are of type D (axis of movement parallel to the probe) or RC (rotation, or translation) and are available inanalog or digital versions controlled by computer.

These sensors operate in the near field and offer a large measurement dynamic from a few nanometers to several tens of millimeters up to 1.5 MHz sampling.

 

 

 

L’article Sensors est apparu en premier sur EOTECH.

]]> Probes and Options https://eotech-sa.com/metrology/micro-displacement-measurement/sensor-probes-and-options/ Thu, 27 Sep 2018 13:51:33 +0000 http://eotech.fr/?p=1652 The geometry, dimensions and material of the probes can be adapted to the application and its environment: ultra-high vacuum, high pressure, high or cryogenic temperatures, etc. We offer you a large number of options to adjust the configuration of the system and its probe to your application.

L’article Probes and Options est apparu en premier sur EOTECH.

]]> The geometry, dimensions and material of the probes can be adapted to the application and its environment: ultra-high vacuum, high pressure, high or cryogenic temperatures, etc.

We offer you a large number of options to adjust the configuration of the system and its probe to your application.

L’article Probes and Options est apparu en premier sur EOTECH.

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