EOTECH - 3D digitisation - roughness - profiles - 3D shape - displacement - photometry - colorimetry

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    Instrumentation - 3D Surface Metrology

    nanoPRO

    This system is capable to measure the shape and waviness of optical surfaces as well as semi-conductors by stitching several individual areas to get the entire area. The shape of samples can be plane or curved.

    A powerful algorithm can assemble several areas in one with an accuracy close to the nanometer. This system will be able to solve  polished and complex surface measurement.

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