EOTECH - 3D digitisation - roughness - profiles - 3D shape - displacement - photometry - colorimetry

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    Instrumentation - 3D Surface Metrology

    OptoSURF

    Interferometric microscope using phase shifting technique as well as white ligth confocal microscopy - control surface topography - roughness - profilometry microstructure - measuring range Z extent from 0.1 nm at 100 µm

    With a vertical resolution below nanometer, this system can measure polished and super-polished surfaces while it also can measure any surface type and roughness. Different versions adapt small to very large sample size and weigth.

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