EOTECH - 3D digitisation - roughness - profiles - 3D shape - displacement - photometry - colorimetry

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    Instrumentation - 3D Surface Metrology

    HeliInspect H4

    The H4 3D measurement head from Heliotis is using an high speed imager based on white light interferometry which combines sub-micrometer  resolution metrology and large field of views (standard 12.3mm x 12.6mm).

    It has been designed for in-line applications and can be easily integrated by equipment  manufacturers.

     

    Applications:


     •  Micromecanics and micro-optics
     •  Electronics

     •  Life sciences

     •  Forensic and security solutions

     •  Geometry and height measurements

     •  Defaults, scratches, wear

     •  Planarity, coplanarity, deformation

     •  Films thickness


    Advantages:


     • Works on almost any surface

     •  No need of vibration isolation

     •  Very fast non contact measurements

     •  Modular, flexible

     •  Submicron resolution down to 100nm
     •  Very fast non contact measurements

     •  Reliability

     •  Software interfaces : C++, Halcon, LabView, Python

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    • (Documentation)
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    • Heliotis
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